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Integrated Circuits and Semiconductor Failure Analysis
TopicLeading institutions, researchers & key papers
This cluster of papers focuses on advanced techniques and methodologies for failure analysis of integrated circuits. It covers a wide range of topics including photon emission microscopy, laser voltage probing, backside analysis, nanoprobing, fault localization, time-resolved imaging, and electrical characterization. The papers explore innovative approaches to identify and analyze failures in CMOS circuits and other semiconductor devices.
35
Works
IDs:OpenAlex
How has Integrated Circuits and Semiconductor Failure Analysis's publication output changed over time?
ScholarIQpublication output · 2019
1
2019
What are the most-cited papers on Integrated Circuits and Semiconductor Failure Analysis?
ScholarIQmost cited works
High-exposure-durability, high-quantum-efficiency (>90%) backside-illuminated soft-X-ray CMOS sensor
Tetsuo Harada, Nobukazu Teranishi, Takeo Watanabe, Quan Zhou, Jan Bogaerts, Xinyang Wang
S54409865. 201941 CitationsOPEN ACCESS
Where is Integrated Circuits and Semiconductor Failure Analysis research published, and who funds it?
ScholarIQvenues & funding sources
TOP JOURNALS
S5440986541
TOP FUNDERS
National Science Foundation—
NIH—
Wellcome Trust—
European Research Council—
Funder breakdown is a member featureSign up free to unlock
How much of the research on Integrated Circuits and Semiconductor Failure Analysis is open access?
ScholarIQopen access share
100%OPEN ACCESS
Gold
0%
Green
0%
Hybrid
100%
Bronze
0%
Closed
0%
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